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NPDN Governance Committee Report NPDN Regional Network Meeting Notes |
NPDN National Meeting 2007 Poster Abstract Authors: German Hoyos (1), Brendan Gow (1), David Grothaus (1), Joan Lawton (1), Gilberto Olaya (2), Karen Larkin (1), Terry Goddard (1) Affiliations: (1) Envirologix Inc, Portland, ME; and (2) Syngenta Crop Protection, Vero Beach, FL A lateral flow device (LFD) was developed for the detection of Asian Soybean Rust (ASBR), caused by Phakopsora pachyrhizi. The performance of this test was assessed against diseased soybean leaves inoculated with spores of ASBR. Leaves of the V1-V2 stage were inoculated with two levels of spores (high and low) for 11 consecutive days. Inoculated leaves/plants on a given day were considered a set. Each set, after inoculation, was transferred to a growth chamber to allow the infection process to continue under a controlled environment. On the 11th day, only non-symptomatic leaves and leaves showing cholorotic lesions were evaluated with the LFD device by two sampling procedures, Mesh Bag Extraction and Snap Cap Punch. These leaves corresponded to those sets inoculated on days 5-11. The levels of visual infection observed on the tested sets were on the order of 0.2-0.5% (low level of spores) and 10-15 % (high level). The LFD device was able to detect the presence of ASBR on chlorotic lesions and to some extent non-symptomatic lesions.View Poster
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